IS 16855 — Current and voltage sensors or detectors to be used for fault passage indication purposes: Part 100 requirements and proposals for the is/iec 61850 series data model extensions to support fault passage indicators applications

What is IS 16855?

IS 16855 is an Indian Standard published by the Bureau of Indian Standards (BIS) under the title Current and voltage sensors or detectors to be used for fault passage indication purposes: Part 100 requirements and proposals for the is/iec 61850 series data model extensions to support fault passage indicators applications. It falls under the <strong>Electrical Switchgear and Other Electrical Products/Accessories</strong> group and is administered by the Ministry of Power. Certification under this standard is voluntary.

How to get certified for IS 16855

1. 1
   Apply online — Submit the BIS portal application with product details, factory information, and test reports.
2. 2
   Lab testing — Submit product samples to a BIS-recognised testing laboratory for evaluation against the standard.
3. 3
   Factory inspection — A BIS officer visits your manufacturing facility to verify quality control systems.
4. 4
   Licence grant — On approval, BIS issues the licence. You may then affix the ISI Mark on compliant products.

Related Indian Standards

• IS 16855Current and voltage sensors or detectors, to be used for fault passage indication purposes: Part 1 general principles and requirements
• IEC 61850 (Part 7/Sec 2):2010IEC 61850 (Part 7/Sec 2):2010
• IEC 61850 (Part 7/Sec 4):2010IEC 61850 (Part 7/Sec 4):2010
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• IS 14700Electromagnetic compatibility (EMC): Part 4 testing and measurement techniques: Sec 34 voltage dips, short interruptions and voltage variations immunity tests for current more than 16 A per phase
• IS 14700Electromagnetic compatibility (EMC): Part 4 testing and measurement techniques: Sec 34 voltage dips, short interruptions and voltage variations immunity tests for current more than 16 A per phase
• IS 14700Electromagnetic compatibility (EMC): Part 4 testing and measurement techniques: Sec 34 voltage dips, short interruptions and voltage variations immunity tests for current more than 16 A per phase
• IS 14700Electromagnetic compatibility (EMC): Part 4 testing and measurement techniques: Sec 34 voltage dips, short interruptions and voltage variations immunity tests for current more than 16 A per phase
• IS 14700Electromagnetic compatibility (EMC): Part 4 testing and measurement techniques: Sec 34 voltage dips, short interruptions and voltage variations immunity tests for current more than 16 A per phase
• IS 14700Electromagnetic compatibility (EMC): Part 4 testing and measurement techniques: Sec 34 voltage dips, short interruptions and voltage variations immunity tests for current more than 16 A per phase
• IS 14700Electromagnetic compatibility (EMC): Part 4 testing and measurement techniques: Sec 34 voltage dips, short interruptions and voltage variations immunity tests for current more than 16 A per phase
• IS 14700Electromagnetic compatibility (EMC): Part 4 testing and measurement techniques: Sec 34 voltage dips, short interruptions and voltage variations immunity tests for current more than 16 A per phase
• IS 14700Electromagnetic compatibility (EMC): Part 4 testing and measurement techniques: Sec 34 voltage dips, short interruptions and voltage variations immunity tests for current more than 16 A per phase
• IS 14700 (Part 4/Sec 6)Electromagnetic Compatibility EMC Part 4: Testing and Measurement Techniques Section 6: Immunity to Conducted Disturbances Induced by Radio-Frequency Fields First Revision
• IS 14794ISOBUTENE-ISOPRENE RUBBER IIR EVALUATION PROCEDURES Third Revision
• IS 16855Current and voltage sensors or detectors to be used for fault passage indication purposes: Part 100 requirements and proposals for the is/iec 61850 series data model extensions to support fault passage indicators applications

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